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We present the results of direct measurements of the effect of mechanically applied biaxial strain on Auger recombination rates in InGaAs quantum wells grown on InP. By mounting these structures on a flexible membrane, we applied strain mechanically rather than by changing the quantum well alloy fraction. Specifically, we employed time-resolved photoluminescence spectroscopy to probe the recombination dynamics in the degenerate carrier regime. From these measurements, we extract the non-degenerate cubic Auger coefficient C30. We found that applying 1.59% tensile biaxial strain increased the Auger C30 coefficient by 325% in one of our samples. These results support the hypothesis that the mechanical strain induced by heteroepitaxy plays a direct role in mitigating Auger recombination in InP-based telecommunication-range lasers.more » « lessFree, publicly-accessible full text available January 20, 2026
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